Conclusion
Open functionality and re-use of software
- Real applications, real markets
- Performance compares with hardwired functions
- Market scope larger than 3D graphics
- Software will port rapidly to future generations
Roadmap into future, beyond 0.13u technologies
- Verification task massively simplified with replication
- Highly regular custom silicon layout
- Deep sub-micron design barrier solution
- 5k man/gate/day productivity (from ground zero)
- Higher on next generations
- Highly parallel embedded test (Using EPU)
Redundancy for yield management
- Cost reduction on large die